The present disclosure is related to systems and methods for image processing. The method may include obtaining an image including at least one of a first type of artifact or a second type of artifact. The method may include determining, based on a trained machine learning model, at least one of first information associated with the first type of artifact or second information associated with the second type of artifact in the image. The trained machine learning model may include a first trained model and a second trained model. The first trained model may be configured to determine the first information. The second trained model may be configured to determine the second information. The method may include generating a target image based on at least part of the first information and the second information.