Invention Grant
- Patent Title: Detrapping electrons to prevent quick charge loss during program verify operations in a memory device
-
Application No.: US17249433Application Date: 2021-03-02
-
Publication No.: US11508449B2Publication Date: 2022-11-22
- Inventor: Ching-Huang Lu , Vinh Q. Diep , Zhengyi Zhang , Yingda Dong
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/08 ; G11C16/10 ; G11C16/30

Abstract:
Processing logic in a memory device initiates a program operation on a memory array, the program operation comprising a program phase and a program verify phase. The processing logic further causes a negative voltage signal to be applied to a first selected word line of a block of the memory array during the program verify phase of the program operation, wherein the first selected word line is coupled to a corresponding first memory cell of a first plurality of memory cells in a string of memory cells in the block, wherein the first selected word line is associated with the program operation.
Public/Granted literature
- US20220199175A1 DETRAPPING ELECTRONS TO PREVENT QUICK CHARGE LOSS DURING PROGRAM VERIFY OPERATIONS IN A MEMORY DEVICE Public/Granted day:2022-06-23
Information query