Invention Grant
- Patent Title: Molded image sensor chip scale packages and related methods
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Application No.: US17162014Application Date: 2021-01-29
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Publication No.: US11508766B2Publication Date: 2022-11-22
- Inventor: Weng-Jin Wu
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: Adam R. Stephenson, LTD.
- Main IPC: H01L31/0203
- IPC: H01L31/0203 ; H01L27/146 ; H01L23/31

Abstract:
Implementations of a molded image sensor chip scale package may include an image sensor having a first side and a second side. A first cavity wall and a second cavity wall may be coupled to the first side of the image sensor and extend therefrom. The first cavity wall and the second cavity wall may form a cavity over the image sensor. A transparent layer may be coupled to the first cavity wall and the second cavity wall. A redistribution layer (RDL) may be coupled to the second side of the image sensor. At least one interconnect may be directly coupled to the RDL. A mold material may encapsulate a portion of the RDL, a portion of the image sensor, and a side of each cavity wall, and a portion of the transparent layer.
Public/Granted literature
- US20210151488A1 MOLDED IMAGE SENSOR CHIP SCALE PACKAGES AND RELATED METHODS Public/Granted day:2021-05-20
Information query
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