Invention Grant
- Patent Title: Systems and methods for testing electronic devices using master-slave test architectures
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Application No.: US16932396Application Date: 2020-07-17
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Publication No.: US11509563B2Publication Date: 2022-11-22
- Inventor: Ina Huh , Rajeev Tiwari , Jin Ryu
- Applicant: Contec, LLC
- Applicant Address: US NY Schenectady
- Assignee: Contec, LLC
- Current Assignee: Contec, LLC
- Current Assignee Address: US NY Schenectady
- Agency: Taylor English Duma LLP
- Main IPC: H04L12/28
- IPC: H04L12/28 ; H04L43/50 ; H04L43/12 ; H04L12/403
Abstract:
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
Information query
