Invention Grant
- Patent Title: Semiconductor structure with doped via plug
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Application No.: US17007661Application Date: 2020-08-31
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Publication No.: US11515206B2Publication Date: 2022-11-29
- Inventor: Tung-Po Hsieh , Su-Hao Liu , Hong-Chih Liu , Jing-Huei Huang , Jie-Huang Huang , Lun-Kuang Tan , Huicheng Chang , Liang-Yin Chen , Kuo-Ju Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L29/66 ; H01L29/78 ; H01L23/532 ; H01L21/8234 ; H01L23/522 ; H01L27/088 ; H01L27/092 ; H01L21/8238 ; H01L29/417

Abstract:
A semiconductor structure is provided. The semiconductor structure includes a gate structure over a fin structure. The semiconductor structure also includes a source/drain structure in the fin structure and adjacent to the gate structure. The semiconductor structure also includes a first contact plug over the source/drain structure. The semiconductor structure also includes a first via plug over the first contact plug. The semiconductor structure also includes a dielectric layer surrounding the first via plug. The first via plug includes a first group IV element and the dielectric layer includes the first group IV element and a second group IV element.
Information query
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