Invention Grant
- Patent Title: Systems and methods for calibrating temperature sensors
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Application No.: US16581659Application Date: 2019-09-24
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Publication No.: US11519795B2Publication Date: 2022-12-06
- Inventor: Xu Jason Ma , Elie A. Maalouf
- Applicant: NXP USA, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G05F1/10 ; G01K3/00 ; G01K7/02

Abstract:
Embodiments of a device and method are disclosed. In an embodiment, a calibration circuit for a temperature sensor circuit includes a current source configured to generate a temperature independent reference current and further includes a voltage window generator circuit. The voltage window generator circuit is configured to generate a voltage window for the temperature sensor circuit using at least the temperature independent reference current. The voltage window is defined by a first reference voltage and a second reference voltage. The voltage window generator circuit is further configured to control a width of the voltage window to include a range of proportional to absolute temperature (PTAT) voltage outputs of a temperature sensor in the temperature sensor circuit.
Public/Granted literature
- US20210088389A1 SYSTEMS AND METHODS FOR CALIBRATING TEMPERATURE SENSORS Public/Granted day:2021-03-25
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