- Patent Title: Kit, method and reagent for measuring measurement target substance
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Application No.: US16585406Application Date: 2019-09-27
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Publication No.: US11519860B2Publication Date: 2022-12-06
- Inventor: Hiroyuki Chiku , Tomoaki Yoshioka , Kousuke Watanabe , Kazuhiro Hamada , Kouitsu Sasaki
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2017-066924 20170330
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N33/543 ; C07F5/02

Abstract:
An object of the present invention is to provide a kit, a method, and a reagent which prevent the problem of false positive due to nonspecific adsorption, suppress the increase in noise to be generated, and are capable of achieving high-precision measurement of a measurement target substance in a wide concentration range from a low concentration to a high concentration. According to the present invention, there is provided a kit for measuring a measurement target substance, the kit including: a first particle having a label and modified with a first binding substance; a second particle having no label and modified with a second binding substance; a flow channel for flowing the first particle and the second particle; and a substrate having a third binding substance capable of specifically binding to the measurement target substance or a substance capable of binding to the first binding substance, in which the first particle having a label is a luminescent labeled particle containing at least one kind of compound represented by Formula (1) and a particle. Each symbol in Formula (1) has the meaning described in the present specification.
Public/Granted literature
- US20200096445A1 KIT, METHOD AND REAGENT FOR MEASURING MEASUREMENT TARGET SUBSTANCE Public/Granted day:2020-03-26
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