Invention Grant
- Patent Title: Structure evaluation system, structure evaluation apparatus, and structure evaluation method
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Application No.: US17012604Application Date: 2020-09-04
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Publication No.: US11519883B2Publication Date: 2022-12-06
- Inventor: Sanae Iida , Takashi Usui
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Main IPC: G01N29/44
- IPC: G01N29/44 ; G01N29/14 ; G01M7/02 ; G01M5/00

Abstract:
According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
Public/Granted literature
- US20210096110A1 STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD Public/Granted day:2021-04-01
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