Invention Grant
- Patent Title: System and method for automatic program repair using fast-result test cases
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Application No.: US17135668Application Date: 2020-12-28
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Publication No.: US11520689B2Publication Date: 2022-12-06
- Inventor: Eric A. Bier , Alexandre Campos Perez
- Applicant: Palo Alto Research Center Incorporated
- Applicant Address: US CA Palo Alto
- Assignee: Palo Alto Research Center Incorporated
- Current Assignee: Palo Alto Research Center Incorporated
- Current Assignee Address: US CA Palo Alto
- Agency: Yao Legal Services, Inc.
- Agent Shun Yao
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/36

Abstract:
One embodiment provides a system for automatic program repair (APR). The system identifies a first set of components under repair in a software system and determines, while executing an original test, second and third sets of components that are executed before and after, respectively, the first set of components. The system generates a first block of mock code that runs faster and simulates runtime behaviors of the second set of components, identifies a code region within the third set of components that affects a test result of the software system, and generates a second block of mock code that runs faster and affects the test result similarly. The system generates a fast-result test by replacing the second set of components with the first block of mock code and replacing the third set of components with the second block of mock code and performs APR by executing the fast-result test.
Public/Granted literature
- US20220206930A1 SYSTEM AND METHOD FOR AUTOMATIC PROGRAM REPAIR USING FAST-RESULT TEST CASES Public/Granted day:2022-06-30
Information query