• Patent Title: Memory cell and operating method of memory cell
  • Application No.: US17192762
    Application Date: 2021-03-04
  • Publication No.: US11527288B2
    Publication Date: 2022-12-13
  • Inventor: Jae Hyun Han
  • Applicant: SK hynix Inc.
  • Applicant Address: KR Icheon-si
  • Assignee: SK hynix Inc.
  • Current Assignee: SK hynix Inc.
  • Current Assignee Address: KR Icheon-si
  • Priority: KR10-2020-0111938 20200902
  • Main IPC: G11C11/00
  • IPC: G11C11/00 G11C13/00
Memory cell and operating method of memory cell
Abstract:
A memory cell includes a first electrode, a second electrode, a variable resistance layer located between the first electrode and the second electrode, and a ferroelectric layer located between the variable resistance layer and the second electrode, wherein the variable resistance layer is maintained in an amorphous state during a program operation.
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