- Patent Title: Semiconductor device and memory abnormality determination system
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Application No.: US16951537Application Date: 2020-11-18
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Publication No.: US11527297B2Publication Date: 2022-12-13
- Inventor: Shun Fukushima
- Applicant: ROHM Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: ROHM Co., Ltd.
- Current Assignee: ROHM Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Chip Law Group
- Priority: JPJP2019-211341 20191122
- Main IPC: G11C29/02
- IPC: G11C29/02 ; G11C29/38 ; G06F1/26 ; G11C29/14 ; G11C29/12 ; G01R31/74

Abstract:
Disclosed herein is a semiconductor device including a non-volatile memory unit. The non-volatile memory unit has a subject current path disposed in a semiconductor integrated circuit and a fuse element inserted in series on the subject current path, and changes output data according to a voltage between both ends of the fuse element when supply of a subject current to the subject current path is intended. A current supply part that switches the subject current between a plurality of stages is disposed in the non-volatile memory unit.
Public/Granted literature
- US20210158884A1 SEMICONDUCTOR DEVICE AND MEMORY ABNORMALITY DETERMINATION SYSTEM Public/Granted day:2021-05-27
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