Invention Grant
- Patent Title: Abnormality diagnosis device and abnormality diagnosis method
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Application No.: US17291278Application Date: 2018-12-27
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Publication No.: US11527987B2Publication Date: 2022-12-13
- Inventor: Hiroshi Inoue , Makoto Kanemaru , Junji Hori , Tomoaki Takewa , Takuma Sasai
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Xsensus LLP
- International Application: PCT/JP2018/048221 WO 20181227
- International Announcement: WO2020/136823 WO 20200702
- Main IPC: H02P29/028
- IPC: H02P29/028 ; H02P29/40

Abstract:
Provided is an abnormality diagnosis device including: a physical quantity measurement processor configured to acquire, as time-series data, a physical quantity of an electric motor or a load; a feature parameter calculation processor configured to calculate feature parameters; a correlation function creation processor configured to create a correlation function for two or more feature parameters, and calculate a correlation coefficient corresponding to a measurement result of the physical quantity that changes depending on an abnormality occurrence state; a database configured to store in advance reference data in which a remaining time until a failure is caused and the correlation coefficient are associated with each other; and a diagnosis processor configured to extract from the reference data the remaining time corresponding to the correlation coefficient, and identify the remaining time until the electric motor or the load causes a failure or a part that has caused a failure.
Public/Granted literature
- US20220006417A1 ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS METHOD Public/Granted day:2022-01-06
Information query
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