Invention Grant
- Patent Title: Abnormality determination device and abnormality determination system
-
Application No.: US16925341Application Date: 2020-07-10
-
Publication No.: US11531327B2Publication Date: 2022-12-20
- Inventor: Keita Hada
- Applicant: FANUC Corporation
- Applicant Address: JP Yamanashi
- Assignee: FANUC Corporation
- Current Assignee: FANUC Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: JPJP2019-131452 20190716
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06N20/00

Abstract:
An abnormality determination device acquires observation data observed during an operation of an industrial machine, extracts partial time-series data, including a portion representative of a feature of an operating state at a specified timing, from the observation data, calculates a statistical amount from the extracted partial time-series data, and performs processing for machine learning related to determination of operation abnormality of the industrial machine, based on the calculated statistical amount.
Public/Granted literature
- US20210018904A1 ABNORMALITY DETERMINATION DEVICE AND ABNORMALITY DETERMINATION SYSTEM Public/Granted day:2021-01-21
Information query