Invention Grant
- Patent Title: Analyzing method
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Application No.: US16430179Application Date: 2019-06-03
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Publication No.: US11532470B2Publication Date: 2022-12-20
- Inventor: Pradip Girdhar Chaudhari , Che-Hui Lee , Wen-Cheng Yang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT
- Agent Anthony King
- Main IPC: G01B7/004
- IPC: G01B7/004 ; G01D5/14 ; H01J37/34 ; G01B7/00

Abstract:
A method includes providing a jig including a predetermined center and a magnetron installed on the jig; rotating the magnetron and obtaining a measured first magnetic flux density at the predetermined center of the jig; defining a first area of the magnetron based on the measured first magnetic flux density; rotating the magnetron and measuring a plurality of second magnetic flux densities within the first area of the magnetron; deriving a measured second magnetic flux density among the plurality of second magnetic flux densities; comparing the measured second magnetic flux density with a predetermined threshold; and performing an operation based on the comparison.
Public/Granted literature
- US20200168444A1 ANALYZING METHOD Public/Granted day:2020-05-28
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