Invention Grant
- Patent Title: Method of forming image sensor device
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Application No.: US17183871Application Date: 2021-02-24
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Publication No.: US11532662B2Publication Date: 2022-12-20
- Inventor: Chia-Yu Wei , Yen-Liang Lin , Kuo-Cheng Lee , Hsun-Ying Huang , Hsin-Chi Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L31/103 ; H01L31/0352 ; H01L31/0336 ; H01L31/028 ; H01L31/0312 ; H01L31/0304 ; H01L31/0296

Abstract:
A method includes providing a semiconductor substrate having a front side surface and a back side surface opposite to the front side surface. A photosensitive region of the semiconductor substrate is etched to form a recess. A semiconductor material is deposited on the semiconductor substrate to form a radiation sensing member filling the recess. The semiconductor material has an optical band gap energy smaller than 1.77 eV. A device layer is formed over the front side surface of the semiconductor substrate and the radiation sensing member. A trench isolation is formed in an isolation region of the semiconductor substrate and extending from the back side surface of the semiconductor substrate.
Public/Granted literature
- US20210202564A1 METHOD OF FORMING IMAGE SENSOR DEVICE Public/Granted day:2021-07-01
Information query
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