Invention Grant
- Patent Title: Gate cut structure and method of forming the same
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Application No.: US17164643Application Date: 2021-02-01
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Publication No.: US11532744B2Publication Date: 2022-12-20
- Inventor: Chun-Yuan Chen , Pei-Yu Wang , Huan-Chieh Su , Yi-Hsun Chiu , Cheng-Chi Chuang , Ching-Wei Tsai , Kuan-Lun Cheng , Chih-Hao Wang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/423 ; H01L29/66 ; H01L29/06

Abstract:
Semiconductor devices and methods of forming the same are provided. A semiconductor device according to the present disclosure includes a first gate structure disposed over a first backside dielectric feature, a second gate structure disposed over a second backside dielectric feature, a gate cut feature extending continuously from between the first gate structure and the second gate structure to between the first backside dielectric feature and the second backside dielectric feature, and a liner disposed between the gate cut feature and the first backside dielectric feature and between the gate cut feature and the second backside dielectric feature.
Public/Granted literature
- US20220131004A1 GATE CUT STRUCTURE AND METHOD OF FORMING THE SAME Public/Granted day:2022-04-28
Information query
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