- Patent Title: X-ray image processing method and x-ray image processing apparatus
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Application No.: US16751319Application Date: 2020-01-24
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Publication No.: US11540785B2Publication Date: 2023-01-03
- Inventor: Jaemock Yl , Chaeyeong Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2019-0010064 20190125
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/02 ; G06T7/00 ; G06T11/00

Abstract:
An X-ray image processing method, including obtaining a first X-ray image of an object including a plurality of materials including a first material and a second material; obtaining a first partial image generated by imaging the first material and a second partial image generated by imaging the first material overlapping the second material from the first X-ray image; obtaining first information related to a stereoscopic structure of the first material, based on the first partial image included in the first X-ray image; and obtaining second information about the second material based on the first information and the second partial image.
Public/Granted literature
- US20200237319A1 X-RAY IMAGE PROCESSING METHOD AND X-RAY IMAGE PROCESSING APPARATUS Public/Granted day:2020-07-30
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