Invention Grant
- Patent Title: Method for process monitoring
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Application No.: US16615487Application Date: 2018-04-10
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Publication No.: US11543279B2Publication Date: 2023-01-03
- Inventor: Armin Wernet , Kaj Uppenkamp , Florian Falger
- Applicant: Endress+Hauser SE+Co. KG
- Applicant Address: DE Maulburg
- Assignee: Endress+Hauser SE+Co. KG
- Current Assignee: Endress+Hauser SE+Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Endress+Hauser (USA) Holding Inc.
- Agent Kelly J. Smith
- Priority: DE102017111393.2 20170524
- International Application: PCT/EP2018/059126 WO 20180410
- International Announcement: WO2018/215129 WO 20181129
- Main IPC: G01F23/26
- IPC: G01F23/26 ; G01R27/26 ; G01F23/00 ; G01F23/80

Abstract:
Provided is a method for process monitoring in automation technology based at least on one capacitive and/or conductive measuring probe for determining at least one process variable of at least one medium in a container, an apparatus suitable for executing the method, as well as a computer program and a computer readable medium. The method includes method steps of ascertaining whether the measuring probe is at least partially in contact with the medium and registering as a function of time at least an electrical conductivity of the medium, a dielectric constant of the medium and/or a degree of coverage of the measuring probe by the medium. The method also includes a step of monitoring the process running within the container based on the electrical conductivity, the dielectric constant and/or the degree of coverage as a function of time.
Public/Granted literature
- US20200158554A1 METHOD FOR PROCESS MONITORING Public/Granted day:2020-05-21
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