Invention Grant
- Patent Title: Method for measuring residual stress of curved-surface bulk material
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Application No.: US17126385Application Date: 2020-12-18
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Publication No.: US11543310B2Publication Date: 2023-01-03
- Inventor: Zong-Rong Liu , Hsiu-An Tsai
- Applicant: METAL INDUSTRIES RESEARCH&DEVELOPMENT CENTRE
- Applicant Address: TW Kaohsiung
- Assignee: METAL INDUSTRIES RESEARCH&DEVELOPMENT CENTRE
- Current Assignee: METAL INDUSTRIES RESEARCH&DEVELOPMENT CENTRE
- Current Assignee Address: TW Kaohsiung
- Agency: WPAT, PC
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01L1/25

Abstract:
A method for measuring a residual stress of a curved-surface bulk material includes steps of: locating a point at which a to-be-detected curved surface of a curved-surface bulk material has a highest curvature as a to-be-detected point; applying an instrument integrating an X-ray light resource and a detector, measuring the to-be-detected point by using an X-ray diffraction theory, and analyzing and calculating, in combination with a cos α method, a strain value measured by using the instrument; and calculating, in combination with material property measurement data of the curved-surface bulk material, a curved-surface residual stress by introducing a curved-surface bulk material residual stress calculation model.
Public/Granted literature
- US20220196496A1 METHOD FOR MEASURING RESIDUAL STRESS OF CURVED-SURFACE BULK MATERIAL Public/Granted day:2022-06-23
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