Invention Grant
- Patent Title: Automatic analysis system
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Application No.: US16326468Application Date: 2016-08-25
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Publication No.: US11543422B2Publication Date: 2023-01-03
- Inventor: Kiyohiro Sugiyama
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2016/074839 WO 20160825
- International Announcement: WO2018/037537 WO 20180301
- Main IPC: G01N35/00
- IPC: G01N35/00

Abstract:
The automatic analysis system comprises an analysis device which introduces sample containers which have been placed at a predetermined placement location into an analysis unit to perform analysis on the samples, and a management device which has a function of transmitting identification information for a sample to said analysis device when an analysis request has been made for that sample. The analysis device comprises a sample information management unit which retains sample identification information transmitted from the management device as analysis-requested sample information and retains identification information for samples which have been analyzed by the analysis unit as analysis-completed sample information.
Public/Granted literature
- US20210293837A1 AUTOMATIC ANALYSIS SYSTEM Public/Granted day:2021-09-23
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