Invention Grant
- Patent Title: Impedance measuring apparatus
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Application No.: US17355375Application Date: 2021-06-23
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Publication No.: US11543443B2Publication Date: 2023-01-03
- Inventor: Wonseok Lee , Ji-Hoon Suh , Minkyu Je , Sang Joon Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , Korea Advanced Institute of Science and Technology
- Applicant Address: KR Suwon-si; KR Daejeon
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,Korea Advanced Institute of Science and Technology
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Suwon-si; KR Daejeon
- Agency: NSIP Law
- Priority: KR10-2020-0134627 20201016
- Main IPC: G01R27/16
- IPC: G01R27/16 ; G01N27/02 ; H03M1/00 ; A61B5/053

Abstract:
An impedance measuring apparatus is disclosed. The impedance measuring apparatus includes an input current generator configured to generate a sinusoidal input signal of a carrier frequency, a first electrode configured to apply the sinusoidal input signal to an object which has an impedance, a second electrode configured to receive an amplitude modulated signal from the object, a first amplifier configured to amplify the received amplitude modulated signal and output a first amplified signal, a baseline signal subtractor configured to subtract a baseline signal generated based on the first amplified signal from the amplitude modulated signal and output a subtraction modulated signal, an analog-to-digital converter (ADC) configured to convert the subtraction modulated signal to a digital modulated signal, and an impedance measurer configured to measure the impedance based on the digital modulated signal.
Public/Granted literature
- US20220120797A1 IMPEDANCE MEASURING APPARATUS Public/Granted day:2022-04-21
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