Invention Grant
- Patent Title: Double-beam test probe
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Application No.: US16141422Application Date: 2018-09-25
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Publication No.: US11543454B2Publication Date: 2023-01-03
- Inventor: Paul J. Diglio , Pooya Tadayon , Karumbu Meyyappan
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Essential Patents Group, LLP.
- Main IPC: G01R31/319
- IPC: G01R31/319 ; G01R1/073

Abstract:
Embodiments herein relate to a test probe. The test probe may have a first plurality of beams and a second plurality of beams. An intermediate substrate may be positioned between the first plurality of beams and the second plurality of beams. In embodiments, both the first and second plurality of beams may be angled. Other embodiments may be described or claimed.
Public/Granted literature
- US20200096567A1 DOUBLE-BEAM TEST PROBE Public/Granted day:2020-03-26
Information query
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