Invention Grant
- Patent Title: Circuit measuring device and method
-
Application No.: US17205613Application Date: 2021-03-18
-
Publication No.: US11543455B2Publication Date: 2023-01-03
- Inventor: Chuang-Shun Xu , Ming-Hung Chang , Wen-Yen Chen
- Applicant: ANPEC ELECTRONICS CORPORATION
- Applicant Address: TW Hsinchu
- Assignee: ANPEC ELECTRONICS CORPORATION
- Current Assignee: ANPEC ELECTRONICS CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: TW109141737 20201127
- Main IPC: G01R31/319
- IPC: G01R31/319 ; G01R31/26 ; G09G3/00

Abstract:
A circuit measuring device and a method thereof are provided. A voltage source supplies a common voltage such that a calibration current having a preset current value flows from a current-voltage converter to a final test machine. The current-voltage converter converts the calibration current into a calibration voltage. At this time, a voltage sensing component senses a voltage between an input terminal and an output terminal of the current-voltage converter to output sensed calibration data. The current-voltage converter converts a tested current outputted by a tested circuit into a tested voltage. At this time, the voltage sensing component senses the voltage between the input terminal and the output terminal of the current-voltage converter to output actual sensed data. When the final test machine determines that a difference between the sensed calibration data and the actual sensed data is larger than a threshold, the tested circuit is adjusted.
Public/Granted literature
- US20220170984A1 CIRCUIT MEASURING DEVICE AND METHOD Public/Granted day:2022-06-02
Information query
IPC分类: