- Patent Title: Method and system for full-field interference microscopy imaging
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Application No.: US16837031Application Date: 2020-04-01
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Publication No.: US11543641B2Publication Date: 2023-01-03
- Inventor: Albert Claude Boccara , Fabrice Harms
- Applicant: LLTECH MANAGEMENT
- Applicant Address: FR Paris
- Assignee: LLTECH MANAGEMENT
- Current Assignee: LLTECH MANAGEMENT
- Current Assignee Address: FR Paris
- Agency: Osha Bergman Watanabe & Burton LLP
- Priority: FR1553120 20150410
- Main IPC: G02B21/14
- IPC: G02B21/14 ; G02B21/12 ; G01B9/02091 ; G02B21/00 ; G01N21/47 ; G02B21/08 ; G06T5/50 ; G02B21/18 ; G06T1/00

Abstract:
A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.
Public/Granted literature
- US20200233198A1 METHOD AND SYSTEM FOR FULL-FIELD INTERFERENCE MICROSCOPY IMAGING Public/Granted day:2020-07-23
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