Invention Grant
- Patent Title: Manufacturer self-test for solid-state drives
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Application No.: US16552422Application Date: 2019-08-27
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Publication No.: US11545230B2Publication Date: 2023-01-03
- Inventor: Zhengang Chen , David Patmore , Yingji Ju , Erich F. Haratsch
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agent Christian W. Best
- Main IPC: G11C29/42
- IPC: G11C29/42 ; G11C29/44 ; G11C29/36 ; H03M13/11 ; H04L1/00 ; G06F11/00 ; G11C7/10 ; G06F3/06 ; G11C11/56 ; G11C29/52 ; G11C16/10 ; G11C16/00

Abstract:
An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of input/output requests to a plurality of blocks of the memory that are not marked as bad on a block list, perform a code rate test that programs the plurality of blocks of the memory at three or more code rates of an error correction code scheme, and mark any of the plurality of blocks identified as bad during the code rate test on the block list.
Public/Granted literature
- US20190385694A1 MANUFACTURER SELF-TEST FOR SOLID-STATE DRIVES Public/Granted day:2019-12-19
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