Invention Grant
- Patent Title: Capacitive sensing data integration for plasma chamber condition monitoring
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Application No.: US16812081Application Date: 2020-03-06
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Publication No.: US11545346B2Publication Date: 2023-01-03
- Inventor: Yaoling Pan , Patrick John Tae , Michael D. Willwerth , Leonard Tedeschi , Kiyki-Shiy N. Shang , Mikhail V. Taraboukhine , Charles R. Hardy , Sivasankar Nagarajan
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01J37/32
- IPC: H01J37/32 ; G01N27/22

Abstract:
Capacitive sensors and capacitive sensing data integration for plasma chamber condition monitoring are described. In an example, a plasma chamber monitoring system includes a plurality of capacitive sensors, a capacitance digital converter, and an applied process server coupled to the capacitance digital converter, the applied process server including a system software. The capacitance digital converter includes an isolation interface coupled to the plurality of capacitive sensors, a power supply coupled to the isolation interface, a field-programmable gate-array firmware coupled to the isolation interface, and an application-specific integrated circuit coupled to the field-programmable gate-array firmware.
Public/Granted literature
- US20210280400A1 CAPACITIVE SENSING DATA INTEGRATION FOR PLASMA CHAMBER CONDITION MONITORING Public/Granted day:2021-09-09
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