Invention Grant
- Patent Title: Electronic panel, electronic panel test device, and electronic panel test method
-
Application No.: US16559332Application Date: 2019-09-03
-
Publication No.: US11545627B2Publication Date: 2023-01-03
- Inventor: Daeyoun Cho , Jongwoo Park , Youngtae Choi , Jiho Moon , Ju hee Lee , Younjae Jung
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2018-0136736 20181108
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01L51/00 ; H01L27/32
Abstract:
A test device includes: a plurality of signal test pads electrically connected to pads of an input sensing unit; a power test pad electrically connected to a power pattern of a display unit; a test circuit configured to apply a test signal to the signal test pads; a voltage generator configured to generate a sensing power voltage; and a ripple controller configured to change a voltage level of the sensing power voltage to apply the sensing power voltage to the power test pad.
Public/Granted literature
- US20200152881A1 ELECTRONIC PANEL, ELECTRONIC PANEL TEST DEVICE, AND ELECTRONIC PANEL TEST METHOD Public/Granted day:2020-05-14
Information query
