Invention Grant
- Patent Title: Method and apparatus for scatter artifacts correction in industrial 3-dimensional cone beam computed tomography
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Application No.: US17217452Application Date: 2021-03-30
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Publication No.: US11547379B2Publication Date: 2023-01-10
- Inventor: Chang-Ock Lee , Soomin Jeon
- Applicant: Korea Advanced Institute of Science and Technology
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: PCFB LLC
- Priority: KR10-2020-0116509 20200911
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03

Abstract:
Provided are a method and apparatus for correcting scattering artifacts in industrial three-dimensional (3D) cone beam computed tomography (CT) that may prepare raw data acquired from a subject through computed tomography (CT) and a primary signal acquired from shape prior information of the subject, may estimate a scatter kernel based on the raw data and the primary signal, may acquire result data by removing, from the raw data, a scatter signal estimated based on the scatter kernel, and may generate an image from the result data.
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