Invention Grant
- Patent Title: Air condition measurement apparatus and method
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Application No.: US16480059Application Date: 2018-01-09
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Publication No.: US11549718B2Publication Date: 2023-01-10
- Inventor: Hun-Young Ryu
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Cha & Reiter, LLC
- Priority: KR10-2017-0011249 20170124
- International Application: PCT/KR2018/000407 WO 20180109
- International Announcement: WO2018/139783 WO 20180802
- Main IPC: F24F11/89
- IPC: F24F11/89 ; F24F11/77 ; F24F110/64 ; G01N21/53

Abstract:
The air condition measurement apparatus according to various embodiments of the present invention comprises: a housing comprising a first space and a second space therein; a light-emitting unit which is positioned inside the housing, comprises a first lens, and radiates light to air flowing into the housing; a light-receiving unit which is positioned inside the housing, comprises a second lens, and receives reflected light formed from the reflection of the radiated light, radiated from the light-emitting unit, by foreign substances included in the air; a blocking member which transmits the radiated light or the reflected light and separates the first space, in which the light-emitting unit or the light-receiving unit is disposed, from the second space; and a control unit, wherein the control unit may be configured to measure the condition of air on the basis of a signal corresponding to the reflected light received by the light-receiving unit. Other various embodiments may be possible.
Information query