Invention Grant
- Patent Title: Three-dimensional target with a dual structure, device and method for optical measurement with such a target
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Application No.: US16955876Application Date: 2018-11-29
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Publication No.: US11549801B2Publication Date: 2023-01-10
- Inventor: Philippe Jacot , Sebastien Laporte , Frederic Perret
- Applicant: Watch Out SA
- Applicant Address: CH Geneva
- Assignee: Watch Out SA
- Current Assignee: Watch Out SA
- Current Assignee Address: CH Geneva
- Agency: Pearne & Gordon LLP
- Priority: CH01601/17 20171222,CH01602/17 20171222
- International Application: PCT/IB2018/059462 WO 20181129
- International Announcement: WO2019/123057 WO 20190627
- Main IPC: G01B11/00
- IPC: G01B11/00 ; B23Q17/22 ; B23Q17/24

Abstract:
A three-dimensional target capable of serving as a positioning reference, including, on a useful face, a first structure and a second structure. The first structure defines a planar reference face divided up between at least a first portion whose surface is reflective according to a diffuse reflection, and a second portion whose surface is reflective according to a specular reflection, the second portion being divided up according to a series of localized zones positioned in the first portion. The second structure has an inclined face relative to the planar reference face. Applicable to three-dimensional optical measurement of the relative position between a first object and a second object.
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