Invention Grant
- Patent Title: Phase-shift-based amplitude detector for a high-speed atomic force microscope
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Application No.: US17666132Application Date: 2022-02-07
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Publication No.: US11549964B2Publication Date: 2023-01-10
- Inventor: Atsushi Miyagi , Simon Scheuring
- Applicant: Cornell University
- Applicant Address: US NY Ithaca
- Assignee: Cornell University
- Current Assignee: Cornell University
- Current Assignee Address: US NY Ithaca
- Agency: McDermott Will & Emery LLP
- Main IPC: G01Q60/34
- IPC: G01Q60/34 ; G01Q10/06

Abstract:
An atomic force microscope includes a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion by square-rooting a signal having a value substantially equal to a sum of a square of the received signal and a squared and phase-shifted version of the received signal. The aforementioned processing, in some implementations is implemented using analog circuit components.
Public/Granted literature
- US20220260612A1 PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE MICROSCOPE Public/Granted day:2022-08-18
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