Invention Grant
- Patent Title: Test board, test system and test method for charging device
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Application No.: US16626262Application Date: 2018-09-30
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Publication No.: US11549995B2Publication Date: 2023-01-10
- Inventor: Chen Tian
- Applicant: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Applicant Address: CN Guangdong
- Assignee: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Current Assignee: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
- Current Assignee Address: CN Guangdong
- Agency: Young Basile Hanlon & MacFarlane, P.C.
- International Application: PCT/CN2018/109078 WO 20180930
- International Announcement: WO2020/062235 WO 20200402
- Main IPC: G01R31/40
- IPC: G01R31/40 ; H02J7/00 ; H01M10/42

Abstract:
Embodiments of the present disclosure provide a test system, a test method, and a test board for a charging device. The test board includes: a connecting circuit, configured to be connected to a charging device and a load module respectively, to form a test loop between the charging device and the load module through the connecting circuit; a first communication module, configured to communicate with an upper computer; a second communication module, configured to communicate with the charging device; and a control module, connected to the first communication module and the second communication module respectively, and configured to receive command information sent by the upper computer through the first communication module, and generate a test command according to the command information, to cause the test board or the charging device to execute the test command.
Public/Granted literature
- US20210333332A1 Test Board, Test System and Test Method for Charging Device Public/Granted day:2021-10-28
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