Invention Grant
- Patent Title: Apparatus with latch correction mechanism and methods for operating the same
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Application No.: US17100775Application Date: 2020-11-20
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Publication No.: US11550654B2Publication Date: 2023-01-10
- Inventor: Yuan He , Jiyun Li
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06K9/62 ; G06F1/12 ; G06F1/10

Abstract:
Methods, apparatuses, and systems related to an apparatus are described. The apparatus may include (1) a fuse array configured to provide non-volatile storage of fuse data and (2) local latches configured to store the fuse data during runtime of the apparatus. The apparatus may further include an error processing circuit configured to determine error detection-correction data for the fuse data. The apparatus may subsequently broadcast data stored in the local latches to the error processing circuit to determine, using the error detection-correction data, whether the locally latched data has been corrupted. The error processing circuit may generate corrected data to replace the locally latched data based on determining corruption in the locally latched data.
Public/Granted literature
- US20220164251A1 APPARATUS WITH LATCH CORRECTION MECHANISM AND METHODS FOR OPERATING THE SAME Public/Granted day:2022-05-26
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