Invention Grant
- Patent Title: Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis
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Application No.: US17825531Application Date: 2022-05-26
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Publication No.: US11551040B2Publication Date: 2023-01-10
- Inventor: Takeshi Okazaki
- Applicant: Aon Benfield Inc.
- Applicant Address: US IL Chicago
- Assignee: Aon Benfield Inc.
- Current Assignee: Aon Benfield Inc.
- Current Assignee Address: US IL Chicago
- Agency: Gardella Grace P.A.
- Main IPC: G06Q20/00
- IPC: G06Q20/00 ; G06K9/62 ; G06N3/08 ; G06N20/20 ; G06T7/00 ; G06V10/46 ; G06V20/13
Abstract:
In an illustrative embodiment, methods and systems for automatically categorizing a condition of a property characteristic may include obtaining aerial imagery of a geographic region including the property, identifying features of the aerial imagery corresponding to the property characteristic, analyzing the features to determine a property characteristic classification, and analyzing a region of the aerial imagery including the property characteristic to determine a condition classification.
Public/Granted literature
Information query
