Invention Grant
- Patent Title: System and method for detecting and repairing defective memory cells
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Application No.: US17196758Application Date: 2021-03-09
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Publication No.: US11551778B2Publication Date: 2023-01-10
- Inventor: Melvin K. Benedict , Eric L. Pope
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Park, Vaughan, Fleming & Dowler LLP
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/54

Abstract:
One embodiment provides a memory module that enables online repair of defective memory cells. The memory module includes a memory array storing data, a self-test controller coupled to the memory array and configured to perform a self-test on a region within the memory array without interrupting operations of the memory module, and a memory-repair module configured to repair a defective memory cell identified by the self-test controller.
Public/Granted literature
- US20220293207A1 SYSTEM AND METHOD FOR DETECTING AND REPAIRING DEFECTIVE MEMORY CELLS Public/Granted day:2022-09-15
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