Invention Grant
- Patent Title: Substrate processing method and substrate processing apparatus
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Application No.: US16781362Application Date: 2020-02-04
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Publication No.: US11551933B2Publication Date: 2023-01-10
- Inventor: Mitsuhiro Okada , Yasushi Fujii
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JPJP2019-023883 20190213
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/285 ; C23C16/46

Abstract:
According to one embodiment of the present disclosure, there is provided a substrate processing method including: providing a substrate; forming a seed layer on a surface of the substrate by heating a stage on which the substrate is placed to a first temperature and supplying a first source gas to the substrate; and forming a metal-containing film by heating the stage on which the substrate is placed to a second temperature and supplying a second source gas and a first reducing gas to the substrate on which the seed layer is formed.
Public/Granted literature
- US20200258748A1 SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2020-08-13
Information query
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