Invention Grant
- Patent Title: Method for analyzing cohesive failure of electrode
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Application No.: US16995976Application Date: 2020-08-18
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Publication No.: US11552288B2Publication Date: 2023-01-10
- Inventor: In Young Song , Joo Yul Baek , Jeong Kyu Lee , Sung Joon Oh , Jong Chan Lee
- Applicant: LG CHEM, LTD.
- Applicant Address: KR Seoul
- Assignee: LG CHEM, LTD.
- Current Assignee: LG CHEM, LTD.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2019-0101342 20190819,KR10-2020-0097112 20200804
- Main IPC: H01M10/42
- IPC: H01M10/42 ; H01M4/36 ; H01M4/04 ; H01M4/133 ; H01M4/62 ; H01M10/0525 ; H01M4/02

Abstract:
A method for quantitatively analyzing cohesive failure of an electrode analyzes cohesive failure of an electrode and includes preparing an electrode in which an electrode material mixture layer including an electrode active material, a conductive agent, and a binder is formed on a current collector, measuring shear strength (σ) data according to a cutting depth while cutting the electrode material mixture layer from a surface thereof until reaching the current collector using a surface and interfacial cutting analysis system (SAICAS), obtaining a regression curve of shear strength according to the cutting depth from the shear strength (σ) data, and determining a cutting depth, at which the shear strength is minimum in the regression curve, as a location of cohesive failure.
Public/Granted literature
- US20210057728A1 METHOD FOR ANALYZING COHESIVE FAILURE OF ELECTRODE Public/Granted day:2021-02-25
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