Invention Grant
- Patent Title: Layer 1 signal to interference plus noise ratio (L1-SINR) measurements with network configured measurement gaps
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Application No.: US17353554Application Date: 2021-06-21
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Publication No.: US11552695B2Publication Date: 2023-01-10
- Inventor: Qian Zhang , Yan Zhou , Tao Luo
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Patterson + Sheridan, LLP
- Main IPC: H04B7/08
- IPC: H04B7/08 ; H04B7/06 ; H04B17/345 ; H04W24/08 ; H04W24/10 ; H04L5/00

Abstract:
Aspects of the disclosure relate to a method for wireless communication at a user equipment (UE). In some aspects, the UE receives, from a base station, configuration information for performing beam pair selection measurements with respect to a subset of candidate beams at the UE. The beam pair selection measurements may include at least self-interference measurements at the UE between one or more transmit (Tx) beams and one or more receive (Rx) beams in the subset of candidate beams. The configuration information indicates measurement gaps between the self-interference measurements. The UE performs the beam pair selection measurements based on the configuration information and selects at least one pair of Tx/Rx beams based on the performed beam pair selection measurements. The UE transmits a report including the selected at least one pair of Tx/Rx beams to the base station.
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