Invention Grant
- Patent Title: Method and electronic device for analyzing image
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Application No.: US17026020Application Date: 2020-09-18
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Publication No.: US11553178B2Publication Date: 2023-01-10
- Inventor: Jaeil Jung , Junik Jang , Jonghee Hong
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2019-0115481 20190919
- Main IPC: H04N19/176
- IPC: H04N19/176 ; H04N19/117 ; H04N19/182 ; G06T9/00

Abstract:
A method for analyzing an image for anomaly detection includes obtaining a first image. The method also includes generating a second image by auto-encoding the first image. The method additionally includes extracting first and second feature vectors from the first and second images, respectively. The method further includes filtering each of the first and second feature vectors by using a filtering vector generated based on first distance values between first respective elements of the first and second feature vectors. Additionally, the method includes determining whether there is an anomaly in the first image based on second distance values between second respective elements of the filtered first and second feature vectors.
Public/Granted literature
- US20210092369A1 METHOD AND ELECTRONIC DEVICE FOR ANALYZING IMAGE Public/Granted day:2021-03-25
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