Invention Grant
- Patent Title: Form measuring instrument and method of detecting abnormality
-
Application No.: US17508106Application Date: 2021-10-22
-
Publication No.: US11555683B2Publication Date: 2023-01-17
- Inventor: Satoshi Yoshitani , Tomoyuki Miyazaki
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2020-185676 20201106
- Main IPC: G01B5/012
- IPC: G01B5/012 ; G01B5/20

Abstract:
A form measuring instrument includes: a contact tip configured to contact with a workpiece; a movement mechanism configured to cause relative movement of the contact tip with respect to the workpiece; a movement controlling unit configured to control the movement mechanism; a contact sensor configured to detect a contact amount of the contact tip with the workpiece and output a detection signal corresponding to the contact amount; and an abnormality determining unit configured to determine an abnormality of sensitivity of the contact sensor based on a change in the detection signal outputted from the contact sensor during an operation of the movement mechanism in which the contact tip is pressed against the workpiece.
Public/Granted literature
- US20220146246A1 FORM MEASURING INSTRUMENT AND METHOD OF DETECTING ABNORMALITY Public/Granted day:2022-05-12
Information query