Invention Grant
- Patent Title: Method and apparatus for use in measurement data acquisition
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Application No.: US16727574Application Date: 2019-12-26
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Publication No.: US11556890B2Publication Date: 2023-01-17
- Inventor: Jens Barrenscheen
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Banner & Witcoff Ltd.
- Priority: DE102015111753.3 20150720
- Main IPC: G08C15/12
- IPC: G08C15/12 ; G06Q10/08 ; G01D5/12 ; H04Q9/02 ; H03M1/12 ; G01R19/25 ; G01R21/133

Abstract:
Methods for use in a measurement system. Some embodiments comprise at least one sensor unit and a control unit, wherein the at least one sensor unit is configured to detect a physical quantity and to form a sensor data signal. The method comprises, at the control unit, receiving a data receive signal from the sensor unit, and interpreting the data receive signal to be one of at least the sensor data signal and another data signal, wherein the interpreting is based on an attribute information intrinsic to the data receive signal. Furthermore, there is a sensor unit for use in measurement data acquisition, an apparatus configured to control a measurement data acquisition, a measurement system for use in measurement data acquisition, and a medium incorporating a sequence of operation steps that, when executed, perform a method for use in a measurement system for data acquisition.
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