An inspection apparatus including: a display device; and one or a plurality of processors, wherein
the one or the plurality of processors is programmed to execute a method including: converting an inspection target image representing an inspection target into a virtual good article image by using a learning model, the learning model being trained so that an image representing a good article is generated based on features of a plurality of targets that are determined as good articles, generating a difference between the virtual good article image and the inspection target image as a defect candidate image, and displaying the defect candidate image on the display device.