Invention Grant
- Patent Title: Dual sensor imaging system and imaging method thereof
-
Application No.: US17216639Application Date: 2021-03-29
-
Publication No.: US11568526B2Publication Date: 2023-01-31
- Inventor: Shih-Yuan Peng , Shu-Chun Cheng , Hsu-Lien Huang , Yun-Chin Li , Kuo-Ming Lai
- Applicant: Altek Semiconductor Corp.
- Applicant Address: TW Hsinchu
- Assignee: Altek Semiconductor Corp.
- Current Assignee: Altek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW109145632 20201223
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T5/50 ; H04N5/33 ; H04N5/357 ; G06T1/00

Abstract:
A dual sensor imaging system and an imaging method thereof are provided. The method includes: identifying an imaging scene; controlling a color sensor and an IR sensor to respectively capture color images and IR images by adopting capturing conditions suitable for the imaging scene; calculating a signal-to-noise ratio (SNR) difference between each color image and the IR images, and a luminance mean value of each color image; selecting the color image and IR image captured under capturing conditions of having the SNR difference less than an SNR threshold and the luminance mean value greater than a luminance threshold to execute a feature domain transformation to extract partial details of the imaging scene; and fusing the selected color image and IR image to adjust the partial details of the color image according to a guidance of the partial details of the IR image to obtain a scene image with full details.
Public/Granted literature
- US20210217153A1 DUAL SENSOR IMAGING SYSTEM AND IMAGING METHOD THEREOF Public/Granted day:2021-07-15
Information query