Invention Grant
- Patent Title: Memory cell and method of operating the same
-
Application No.: US17196131Application Date: 2021-03-09
-
Publication No.: US11568912B2Publication Date: 2023-01-31
- Inventor: Bo-Feng Young , Sai-Hooi Yeong , Chao-I Wu , Chih-Yu Chang , Yu-Ming Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Hauptman Ham, LLP
- Main IPC: G11C11/22
- IPC: G11C11/22 ; H01L27/1159

Abstract:
A memory cell includes a write bit line, a write transistor and a read transistor. The write transistor is coupled between the write bit line and a first node. The read transistor is coupled to the write transistor by the first node. The read transistor includes a ferroelectric layer. The write transistor is configured to set a stored data value of the memory cell by a write bit line signal that adjusts a polarization state of the read transistor. The polarization state corresponds to the stored data value.
Public/Granted literature
- US20210375344A1 MEMORY CELL AND METHOD OF OPERATING THE SAME Public/Granted day:2021-12-02
Information query