Invention Grant
- Patent Title: Semiconductor package with thermal interface material for improving package reliability
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Application No.: US17188332Application Date: 2021-03-01
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Publication No.: US11569145B2Publication Date: 2023-01-31
- Inventor: Sanghyun Lee , Juhyun Lyu , Unbyoung Kang , Chulwoo Kim , Jongho Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2020-0067167 20200603
- Main IPC: H01L23/36
- IPC: H01L23/36 ; H01L23/40 ; H01L25/065

Abstract:
A semiconductor package includes a first semiconductor chip mounted on the package substrate, a second semiconductor mounted on the package substrate and set apart from the first semiconductor chip in a horizontal direction thereby forming a gap between the first semiconductor chip and the second semiconductor chip. The semiconductor package further includes a first thermal interface material layer formed in the gap and having a first modulus of elasticity and a second thermal interface material layer formed on each of the first semiconductor chip and the second semiconductor chip and having a second modulus of elasticity, wherein the first modulus of elasticity is less than the second modulus of elasticity.
Public/Granted literature
- US20210384096A1 SEMICONDUCTOR PACKAGE FOR IMPROVING PACKAGE RELIABILITY Public/Granted day:2021-12-09
Information query
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