Invention Grant
- Patent Title: Enhanced guided wave thermography inspection systems and methods of using the same
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Application No.: US16633855Application Date: 2017-08-01
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Publication No.: US11573192B2Publication Date: 2023-02-07
- Inventor: James F. Landy , Paul J. Zombo , Cody J. Borigo , Joseph L. Rose , Steven E. Owens
- Applicant: Siemens Energy, Inc. , FBS, Inc.
- Applicant Address: US FL Orlando; US PA State College
- Assignee: Siemens Energy, Inc.,FBS, Inc.
- Current Assignee: Siemens Energy, Inc.,FBS, Inc.
- Current Assignee Address: US FL Orlando; US PA State College
- International Application: PCT/US2017/044857 WO 20170801
- International Announcement: WO2019/027444 WO 20190207
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G01N29/06 ; G01N29/34 ; G01N25/72

Abstract:
Non-destructive inspection systems (10) and methods for inspecting structural flaws that may be in a structure (15) based on guided wave thermography. The method may include sweeping a frequency-phase space to maximize ultrasonic energy distribution across the structure while minimizing input energy, e.g., via a plurality of actuators. The system may include transducer elements (12, 14, 16, 17) configured to predominantly generate shear horizontal-type guided waves in the structure to maximize thermal response from any flaws.
Public/Granted literature
- US20200240937A1 ENHANCED GUIDED WAVE THERMOGRAPHY INSPECTION SYSTEMS AND METHODS OF USING THE SAME Public/Granted day:2020-07-30
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