Invention Grant
- Patent Title: Test socket and test apparatus having the same
-
Application No.: US17403348Application Date: 2021-08-16
-
Publication No.: US11573248B2Publication Date: 2023-02-07
- Inventor: Chang Su Oh
- Applicant: TSE CO., LTD.
- Applicant Address: KR Chungcheongnam-do
- Assignee: TSE CO., LTD.
- Current Assignee: TSE CO., LTD.
- Current Assignee Address: KR Chungcheongnam-do
- Priority: KR10-2020-0105310 20200821
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R1/073 ; G01R31/00 ; G01R31/26 ; G01R31/27 ; G01R31/28

Abstract:
The present disclosure discloses a test socket including an inelastic insulating housing formed of an inelastic insulating material having a plurality of housing holes, and a plurality of electro-conductive parts comprising electro-conductive particles in an elastic insulating material, the electro-conductive parts including an electro-conductive part body having a lower end portion to be connected to a signal electrode of the tester, an upper end portion to be connected to the terminal of the device under inspection, and an electro-conductive part bump connected to the electro-conductive part body to protrude from one or both of an upper and lower surface of the inelastic insulating housing.
Public/Granted literature
- US20220057433A1 TEST SOCKET AND TEST APPARATUS HAVING THE SAME Public/Granted day:2022-02-24
Information query