Invention Grant
- Patent Title: Electronic device temperature test on strip film frames
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Application No.: US17029988Application Date: 2020-09-23
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Publication No.: US11573266B2Publication Date: 2023-02-07
- Inventor: Dale Ohmart , Marshall Worrall
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Frank D. Cimino
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/073 ; H01L23/34

Abstract:
A system includes a platform and a contactor. The platform has a side configured to support a frame with a carrier structure and electronic devices each having first and second sides and a terminal, the first side positioned on the carrier structure, and the terminal exposed in a first portion of the second side. The contactor has first and second sides, a contact and a heater. The contact is exposed on the first side of the contactor to contact the terminal in a first portion of the second side of a selected one of the electronic devices, and the heater is exposed on the first side of the contactor to apply heat to a second portion of the second side of the selected one of the electronic devices.
Public/Granted literature
- US20210199712A1 ELECTRONIC DEVICE TEMPERATURE TEST ON STRIP FILM FRAMES Public/Granted day:2021-07-01
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