Invention Grant
- Patent Title: Electromagnetic property measuring device, electromagnetic property measuring system and electromagnetic property measuring method
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Application No.: US17126025Application Date: 2020-12-18
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Publication No.: US11573277B2Publication Date: 2023-02-07
- Inventor: Chun-Pin Wu , Shi-Yuan Tong , Mean-Jue Tung
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: G01R33/12
- IPC: G01R33/12

Abstract:
An electromagnetic property measuring device includes a magnetic conductive structure, a coil, and a scattering parameter measuring unit. The magnetic conductive structure includes a first side facing a sample to be tested and a second side opposite to the first side, and the first side has a magnetic gap. The coil surrounds the magnetic conductive structure to generate a magnetic field with the magnetic conductive structure. The scattering parameter measuring unit is disposed at the first side and located within a range of the magnetic field.
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