Techniques for generating and performing analytical instrument test plans
Abstract:
Techniques and apparatus for analytical instrument management and information assessment processes are described. In one embodiment, for example, an apparatus may include at least one memory and logic coupled to the at least one memory. The logic may be configured to perform a test plan on at least one rubber material analytical instrument via accessing a test plan comprising at least one step, generating test plan results responsive to performing the test plan on the at least one rubber material analytical instrument, analyzing the test plan results, and presenting the test plan results on a plurality of graphical user interface (GUI) objects. Other embodiments are described.
Information query
Patent Agency Ranking
0/0